Specimen preparation of irradiated materials for examination in the atom probe field ion microscope
نویسندگان
چکیده
منابع مشابه
A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips
Atom-probe tomography (APT) is a quantitative technique that permits three-dimensional (3-D) spectroscopic characterization of interfaces and other nanometer-scale features within a material. Specimens for atom-probe tomography (APT) analysis of semiconductor devices and nanostructured materials are typically fabricated employing a focused ion beam (FIB) instrument [1 3] or a dual-beam FIB inst...
متن کاملA Time-of-flight Atom-probe Field-ion Microscope for the Study of Defects in Metals
An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of ...
متن کاملAtom probe tomography of swift ion irradiated multilayers
Nanometer scale layered systems are well suited to investigate atomic transport processes induced by high-energy electronic excitations in materials, through the characterization of the interface transformation. In this study, we used the atom probe technique to determine the distribution of the different elements in a (amorphous-Fe2Tb 5 nm/hcp-Co 3 nm)20 multilayer before and after irradiation...
متن کاملAnalysis at the Atomic Level: The Atom Probe Field-Ion Microscope
Figure 2. Angular distributions of inelastic scattering around the undiffracted beam and around a beam diffracted through an angle a. The shaded area represents the contribution from the diffracted beam to the intensity collected by an on-axis aperture of semi-angle A3. [6] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986). [7] Steele, J...
متن کاملProgress of Three-dimensional Atom Probe Techniques for Analysis of Steel Materials —Development of Atom Probe Specimen Preparation Techniques for Site-specific Regions—
Three-dimensional atom probe (3DAP) is a very powerful tool which can investigate atomic positions of all alloying elements in steel with lattice-spacing spatial resolution. However, the very small analysis volume of 3DAP has limited its application field. To meet the needs for atomic-scale analyses of steel materials, advanced preparation techniques of a needle specimen tip including a site-sp...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Proceedings, annual meeting, Electron Microscopy Society of America
سال: 1994
ISSN: 0424-8201,2690-1315
DOI: 10.1017/s0424820100172140